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Dimensional metrology
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11	NACMA – 3 3rd Tri-National Conference of the North American Coordinate Metrology Association HIGH ACCURACY MEASUREMENTS OF RINGS, PLUGS, STEP-GAUGES AND BALL-BARS USING A CMM COUPLED WITH AN INTERFEROMETRIC LASER Add to Reading List Source URL: www.cenam.mx Language: English - Date: 2009-10-01 13:14:32 Calibration Mitutoyo Dimensional metrology Measurement uncertainty Metrologia NACMA International System of Units Standard Measurement Metrology National Institute of Metrology Standardization and Industrial Quality
12	Microsoft PowerPoint - ACMC 2009 Mexico Final.ppt Add to Reading List Source URL: www.cenam.mx Language: English - Date: 2009-09-06 12:04:38 Metrology Measuring instruments Laser Photonics Coordinate-measuring machine Kilogram Dimensional metrology Measurement Technology Manufacturing
13	FSI ACM-PLUS Selectable 2 or 3 Dimensional Current Meter Compact, cost-effective, high-accuracy meters with vector-averaged current speed and direction Enhanced Design, Specifications, Performance The Falmouth Scientific Add to Reading List Source URL: www.falmouth.com Language: English Measuring instruments Sensors Metrology Fluid dynamics Fluid mechanics Magnetometer Accelerometer Pressure Metre Measurement Physics Electromagnetism
14	Length, Angle and Dimensions The Consultative Committee for Length (CCL) The CCL advises the CIPM on the definition and realization of the metre and practical dimensional and angle measurement from subnanometre to kilome Add to Reading List Source URL: www.bipm.org Language: English - Date: 2014-11-12 04:18:11 Statistics Standards Systems of units SI base units Traceability Calibration International System of Units International Committee for Weights and Measures Dimensional metrology Measurement Metrology Thought
15	“One Second Per Second”∗ Bradford Skow 1 Against Passage Add to Reading List Source URL: web.mit.edu Language: English - Date: 2012-11-05 14:40:43 Systems of units Introductory physics Dimensional analysis Dimensionless quantity Fundamental unit Quantity Ratio International System of Units Dimension Measurement Physics Metrology
16	In: 2006, Corner B.D., Li P., Tocheri M. (Eds.), Three-Dimensional Image Capture and Applications VI, Proc. of SPIE-IS&T Electronic Imaging, SPIE Vol. 6056, San Jose (CA), USA. Overview of 3D surface digitization technol Add to Reading List Source URL: www.hometrica.ch Language: English - Date: 2007-05-18 10:49:33 Measurement Industrial design Manufacturing Metrology 3D scanner Laser scanning Coordinate-measuring machine Image scanner Laser Technology Optics Measuring instruments
17	SEMI® International Standards Information on 3DS-IC Activities January 2014 SEMI 3DS-IC Standards Activities Add to Reading List Source URL: www.gsaglobal.org Language: English - Date: 2014-02-04 09:46:57 Technology Three-dimensional integrated circuit Wafer Applied Materials SUSS MicroTec Metrology 3DS Through-silicon via Semiconductor device fabrication Microtechnology Electronics
18	Dimensional measuring instruments As of the 30 October 2006, all new designs of dimensional measuring instruments that are to be used for legal purposes [where Legislation is in place] are required to be certified under Add to Reading List Source URL: www.gov.uk Language: English - Date: 2015-01-14 09:40:12 European Union Measuring Instruments Directive Type approval International Organization of Legal Metrology Public key certificate Measuring instrument Science Engineering Technology Standards organizations European Union directives Product certification
19	Helmholtz-Fonds e. V. l l o a Add to Reading List Source URL: www.ptb.de Language: English - Date: 2014-10-24 05:17:46 Knowledge Standards organizations Measurement uncertainty International System of Units Coffee Uncertainty Physikalisch-Technische Bundesanstalt Dimensional metrology Measurement Metrology Statistics
20	Microsoft PowerPoint - 4-CCL report to the 25th CGPM Add to Reading List Source URL: www.bipm.org Language: English - Date: 2014-11-24 09:07:35 Dimensional metrology Metre Kilogram International System of Units Surface metrology Traceability Calibration Structured-light 3D scanner Measurement Metrology Nanometrology